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R. Rajsuman
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Title
IEEE Transactions On Instrumentation And Measurement: A Publication Of The Ieee Instrumentation And Measurement Society, Vol.54, No.5, October 2005
Book
oleh
F. Lombardi
,
L. Schiano
,
R
.
Rajsuman
,
M. Sahinoglu
,
S. R. Das
,
C. V Ramamoorthy
,
M. H. Assaf E. M. Petriu
,
W-B. Jone
,
N. Masuda
,
K. Yamashita
,
W. R. Eisenstadt
,
R. M. Fox
,
T. Zhang
,
V. Narayanan
,
X. Xiong
,
Y-L. Wu
,
A. Laknaur
,
H. Hashempour
,
F. J. Meyer
,
J. M. Cazeaux
,
M. OmaƱa
,
C. Metra
,
C. V. Ramamoorthy
,
R. Rosales
,
T. Farahmand
,
S. Tabatabaei
,
A. Ivanov
Terbitan:
IEEE, 2005
Daftar Isi:
';
“
... of VLSI Testing-Future of Semiconductor Test-S. R. Das and
R
.
Rajsuman
, pp. 1559 -Revisiting Response...
”
Available online:
Get online
Favorit
Tersimpan di:
IEEE TRANSACTIONS ON INSTRUMENTATION AND MEASUREMENT: A PUBLICATION OF THE IEEE INSTRUMENTATION AND MEASUREMENT SOCIETY, VOL.55, NO.2, APRIL 2006
Book
oleh
J. Di
,
H. Li
,
R
.
Rajsuman
,
R. Schiano Lo Moriello
,
A. Carullo
,
M. Parvis
,
A. Vallan
,
R. Tittoto
,
l. Benetazzo
,
A. Baccigalupi
,
S. R. Das
,
J.-Y Ryu
,
B. C. Kim
,
I. Sylla
,
Y. Han
,
X Li
,
A. Chandra
,
M.-K. Chen
,
C-C. Tai
,
Y.-J Huang
,
D. P Vasudevan
,
P .K. Lala
,
J. P. Parkerson
,
R. X. Gao
,
Z. Fan
,
C. Affolderbach
,
, F Droz
,
G. Mileti
,
E. Angelini
,
, F Ferraris
,
V. Gallone
,
S. Grassini
,
L. Angrisani,
,
P A. Pegoraro
,
W. J. Burger
,
G. Crupi
,
N. Donato
Terbitan:
THE INSTITUTE OF ELECTRICAL AND ELECTRONICS ENGINEERS,Inc, 2006
Daftar Isi:
';
“
... of VLSI Testing-Future of Semiconductor Test-S. R. Das and
R
.
Rajsuman
, pp. 378 -A New Low-Cost RF Built...
”
Available online:
Get online
Favorit
Tersimpan di:
IEEE TRANSACTIONS ON INSTRUMENTATION AND MEASUREMENT: A PUBLICATION OF THE IEEE INSTRUMENTATION AND MEASUREMENT SOCIETY, VOL.52, NO.5, OCTOBER 2003.
Book
oleh
S. Mourad
,
Fak. Hukum
,
E. M. Petriu
,
S.R. Das
,
R
.
Rajsuman
,
K. Chakabarty
,
M. Seuring
,
M. Sudarma
,
M.H. Assaf
,
W.-B. Jone
,
M. Sahinoglu
,
D.C. Huang
,
P.K. Lala
,
A. L. Burres
,
S.L. Lin
,
S. Krishnan
,
J. Savir
,
Z. Guo
,
A.M. Sheth
,
S.F.-C. Tseng
,
W.T.-K. Chien
,
E. Gong
,
B.-C Cai
,
S. Baglio
,
L. Antoni
,
R. Leveugle
,
B. Feher
,
S.Y.C. Catunda
,
J.-F. Naviner
,
G. S. Deep
,
R.C.S. Freire
,
S. Abou Chahine
,
B. Huyart
,
J. Achkar
,
S. Chen,
,
D.-Y. Jeng
,
H. Hadano
,
Y. Ishiguro
,
M. Nayakama
,
K. Watanabe
,
T. Chiu
Terbitan:
THE INSTITUTE OF ELECTRICAL AND ELECTRONICS ENGINEERS,Inc, 2003
Daftar Isi:
';
“
...-Guest Editorial-S.R. Das And
R
.
Rajsuman
, pp. 1350 -Space Compaction Of Test Responses Using...
”
Available online:
Get online
Favorit
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