Persempit Pencarian
Institusi
Topik
1
620
1
A Measurement Method
1
Architectural Design
1
Embedded Test Resource
1
Experimental Demonstration of a Compact and High-P
1
Handheld-Impedance-Measurement System
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1
Metrological Management of Large-Scale Measuring S
1
New Low-Cost RF Built-In Self-Test Measurement
Nondestructive Analysis of Interconnection in Two-
1
Online Testability
1
Passive Measurement Tool
1
Reduce Required Tester Channels
1
Reversible-Logic Design
1
Sensory Node Controller
1
Spaceborne Particle Detection
1
VLSI Testing-Future of Semiconductor Test
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Pengarang
1
, F Droz
1
, F Ferraris
1
A. Baccigalupi
1
A. Carullo
1
A. Chandra
1
A. Vallan
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1
B. C. Kim
1
C-C. Tai
1
C. Affolderbach
1
D. P Vasudevan
1
E. Angelini
1
G. Crupi
1
G. Mileti
1
H. Li
1
I. Sylla
1
J. Di
1
J. P. Parkerson
1
J.-Y Ryu
1
L. Angrisani,
1
M. Parvis
1
M.-K. Chen
1
N. Donato
1
P .K. Lala
1
P A. Pegoraro
1
R. Rajsuman
1
R. Schiano Lo Moriello
1
R. Tittoto
1
R. X. Gao
1
S. Grassini
1
S. R. Das
1
V. Gallone
1
W. J. Burger
1
X Li
1
Y. Han
1
Y.-J Huang
1
Z. Fan
1
l. Benetazzo
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