IEEE TRANSACTIONS ON INSTRUMENTATION AND MEASUREMENT: A PUBLICATION OF THE IEEE INSTRUMENTATION AND MEASUREMENT SOCIETY, VOL.55, NO.1, FEBRUARY 2006

oleh D. Grimaldi, P.M.T. Broersen And R. Bos, L. Angrisani, V. Haasz, A. Sachencko, J. Zakrzewski, W. Domanski, P. Chaitas, T. Laopulos, W. Winiecki, L. De Vito, S. Rapuano, G. Truglia, Y. V. Kolokolov, S. L. Koschinsky, V.V. Bagrov, T. Andersson, P. Handel, R. Schiano Lo Moriello, J.F. Arrigo, P.M Chau, A.A. Barannik, N.T. Cherpak, D.E. Chuyko, D.W. Braudaway
Terbitan: THE INSTITUTE OF ELECTRICAL AND ELECTRONICS ENGINEERS,Inc, 2006

IEEE TRANSACTIONS ON INSTRUMENTATION AND MEASUREMENT: A PUBLICATION OF THE IEEE INSTRUMENTATION AND MEASUREMENT SOCIETY, VOL.55, NO.2, APRIL 2006

oleh J. Di, H. Li, R. Rajsuman, R. Schiano Lo Moriello, A. Carullo, M. Parvis, A. Vallan, R. Tittoto, l. Benetazzo, A. Baccigalupi, S. R. Das, J.-Y Ryu, B. C. Kim, I. Sylla, Y. Han, X Li, A. Chandra, M.-K. Chen, C-C. Tai, Y.-J Huang, D. P Vasudevan, P .K. Lala, J. P. Parkerson, R. X. Gao, Z. Fan, C. Affolderbach, , F Droz, G. Mileti, E. Angelini, , F Ferraris, V. Gallone, S. Grassini, L. Angrisani,, P A. Pegoraro, W. J. Burger, G. Crupi, N. Donato
Terbitan: THE INSTITUTE OF ELECTRICAL AND ELECTRONICS ENGINEERS,Inc, 2006

IEEE TRANSACTIONS ON INSTRUMENTATION AND MEASUREMENT: A PUBLICATION OF THE IEEE INSTRUMENTATION AND MEASUREMENT SOCIETY, VOL.54, NO.1, FEBRUARY 2005.

oleh T.K. Abdel-Galil, Y.G. Hegazy, M.M.A. Salama, And R. Bartnikas, Fak. Hukum, M. Aiello, A. Cataloitti, V. Cosentino, And S. Nuccio, P. Arpaia, G. Guerra, G. Mensitieri, And R. Schiano Lo Moriello, J.A. Asumadu, R. Tanner, J. Fitzmaurice, M. Kelly, H. Ogunleye, J. Belter,And S.C. Koh, P. Baranyi, A.R . Varko nyi-Koczy,Y. Yam, And R. J. Patton, R.D. Beach, R.W. Conlan, M. C. Godwin, And F. Mousy, A. Burresi, A. Fort, S. Rocchi, M.B. Serrano Santos, N. Ulivieri, And V. Vignoli, C.B. Cameron, R.N. Rodriguez, N.Padget, E. Walusckha, And S. Kizhner, Y.-T. Chen, K.-S. Cheng, J.-K. Liu, And J.-J. Huang, W.-S. Chung, H. Kim, H.-W. Cha, And H.-J.Kim, P. Crama And J. Schoukens, L. Cristaldi, A. Ferrero, A. Monti, F. Ponci, W.Mckay, And R. Dougal
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