1 DEFAULT 1 Universitas Bandar Lampung

1 DEFAULT 1 OPAC Perpustakaan Universitas Bandar Lampung

1 Book Book 1

1 620 1 Built-In Self-Test 1 Crosstalk Bounded 1 Decompression 1 Error Resilience 1 Field-Programmable more ... 1 Full-Scan Circuits 1 Jitter Testing 1 Loopback Test 1 Multiport Memory Arrays Multisite Testing 1 Online Self-Testing 1 Open ATE 1 RBD Tools Using Compression 1 Reliable Compression 1 Semiconductor Test 1 Sequence characterization 1 Testing-Future 1 Third-Party Instruments less ...

1 A. Ivanov 1 A. Laknaur 1 C. Metra 1 C. V Ramamoorthy 1 C. V. Ramamoorthy 1 F. J. Meyer more ... 1 F. Lombardi 1 H. Hashempour 1 J. M. Cazeaux 1 K. Yamashita 1 L. Schiano 1 M. H. Assaf E. M. Petriu 1 M. Omaña 1 M. Sahinoglu 1 N. Masuda 1 R. M. Fox 1 R. Rajsuman 1 R. Rosales 1 S. R. Das 1 S. Tabatabaei 1 T. Farahmand 1 T. Zhang 1 V. Narayanan 1 W-B. Jone 1 W. R. Eisenstadt 1 X. Xiong 1 Y-L. Wu less ...

1 2005

1 IEEE