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Data for: Comparison of the AlN and GaN crystalline quality on 2-inch silicon substrate via two growth methods

Tersimpan di:
Main Author: Li, Yangfeng
Format: Dataset
Terbitan: Mendeley , 2020
Subjects:
Semiconductor
Online Access: https:/data.mendeley.com/datasets/zwmk36df4v
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Daftar Isi:
  • GaN on Si.

Lihat Juga

  • Data for: Comparison of the AlN and GaN crystalline quality on 2-inch silicon substrate via two growth methods
    oleh: Li, Yangfeng
    Terbitan: (2020)
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    Terbitan: (2020)
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    oleh: GROOTE, FRANK PIETER JANNIS DE
    Terbitan: (2003)

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