WVM: A computer program for the determination of lattice parameters and strains in thin films
| Main Author: | CPC, Mendeley |
|---|---|
| Other Authors: | Wieder, Thomas |
| Format: | Dataset |
| Terbitan: |
Mendeley
, 1996
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| Subjects: | |
| Online Access: |
https:/data.mendeley.com/datasets/wx92mbwb96 |
Daftar Isi:
- Abstract X-ray diffraction provides a method for the determination of the strain and stress tensor in a polycrystalline sample. The knowledge of the unstrained lattice parameters is a prerequisite to calculate strains from measured reflection shifts. For thin films a model exists to find the unstrained lattice parameters and the strain or stress tensor together from the measured reflection positions. Title of program: WVM Catalogue Id: ADDM_v1_0 Nature of problem Calculate the strain tensor epsilon 2<->and the strain-free lattice parameters of a thin polycrystalline film from measured X-ray reflection positions. Versions of this program held in the CPC repository in Mendeley Data ADDM_v1_0; WVM; 10.1016/0010-4655(96)00055-0 This program has been imported from the CPC Program Library held at Queen's University Belfast (1969-2019)