Raw data
| Main Author: | Shi, Wei |
|---|---|
| Format: | Dataset |
| Terbitan: |
Mendeley
, 2020
|
| Subjects: | |
| Online Access: |
https:/data.mendeley.com/datasets/kdr9hnj4yn |
Daftar Isi:
- These pictures are the raw AFM topography and Volta potental map at different depths from the surface of the material treated at 0.2 MPa. These Excel tables are the residual stress, average Volta potential, and potential distribution (slightly processed) at different depths from the surface of the material treated at 0.2 MPa.