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Fast LEED intensity calculations for surface crystallography using Tensor LEED

Tersimpan di:
Main Author: CPC, Mendeley
Other Authors: Blum, V., Heinz, K.
Format: Dataset
Terbitan: Mendeley , 2001
Subjects:
Surface Science
Condensed Matter Physics
Crystallography
Computational Physics
Online Access: https:/data.mendeley.com/datasets/js36dx77rz
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Lihat Juga

  • A program for the calculation of x-ray reflection intensities
    oleh: CPC, Mendeley
    Terbitan: (1973)
  • A program for the calculation of X-ray reflection intensities, Part 2
    oleh: CPC, Mendeley
    Terbitan: (1975)
  • A program for the calculation of the intensities of x-ray or neutron powder reflections, part 3
    oleh: CPC, Mendeley
    Terbitan: (1984)
  • Calculation of crystal orientations using laue patterns
    oleh: CPC, Mendeley
    Terbitan: (1979)
  • A computer program written in Mathematica for calculating H2 quasicrystals and their diffraction patterns
    oleh: CPC, Mendeley
    Terbitan: (2001)

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