Reflectivity data for "Structure-Property Relationships at Nafion Thin-film Interfaces: Thickness Effects on Hydration and Anisotropic Ion Transport"
| Main Author: | DeCaluwe, Steven |
|---|---|
| Other Authors: | Dura, Joseph, Baker, Andrew, Bhargava, Pavan, Fischer, John |
| Format: | Dataset |
| Terbitan: |
Mendeley
, 2017
|
| Subjects: | |
| Online Access: |
https:/data.mendeley.com/datasets/jfb9hv4nrh |
Daftar Isi:
- Reflectivity data collected on Nafion thin films (thickness ranging from 5-153 nm). File names give the "effective Nation thickness" (i.e. the thickness if all the water were removed; t5 = "equivalent Nafion thickness of 5 nm), plus the vapor environment (vh = "vapor hydrogen," vd = "vapor deuterium", both at 92% RH in Ar carrier gas, Ar = "Argon,' 0% RH).