Data for: Contactless determination of base resistivity on silicon wafers with highly doped surfaces

Main Author: Hoeffler, Hannes
Format: Dataset
Terbitan: Mendeley , 2019
Subjects:
Online Access: https:/data.mendeley.com/datasets/73yt7m3c8n
Daftar Isi:
  • The database of the central result graph Fig. 4a) is covered by Reaserch_data_figure4a.