Model-Driven Development for scientific computing. Computations of RHEED intensities for a disordered surface. Part II

Main Author: CPC, Mendeley
Other Authors: Daniluk, Andrzej
Format: Dataset
Terbitan: Mendeley , 2010
Subjects:
Online Access: https:/data.mendeley.com/datasets/6rh8wtbrvm
ctrlnum 0.17632-6rh8wtbrvm.1
fullrecord <?xml version="1.0"?> <dc><creator>CPC, Mendeley</creator><title>Model-Driven Development for scientific computing. Computations of RHEED intensities for a disordered surface. Part II </title><publisher>Mendeley</publisher><description>Abstract Modelling, simulation, and visualisation together create the third branch of human knowledge on equal footing with theory and experiment. Model-Driven Development (MDD) has been proposed as a means to support the software development process through the use of a model-centric approach. The objective of this paper is to address the design of an architecture for scientific application that may execute as multithreaded computations, as well as implementations of the related shared data structure... Title of program: Growth09 Catalogue Id: ADVL_v3_0 Nature of problem Molecular beam epitaxy (MBE) is a technique for epitaxial growth via the interaction of one or several molecular or atomic beams that occurs on a surface of a heated crystalline substrate. Reflection high-energy electron diffraction (RHEED) is an important in situ analysis technique, which is capable of giving quantitative information about the growth process of thin films and its control. The analysis of RHEED intensity oscillations has two purposes. One is to control the film growth, and the o ... Versions of this program held in the CPC repository in Mendeley Data ADVL_v1_0; GROWTH; 10.1016/j.cpc.2005.04.005 ADVL_v2_0; GROWTHgr, GROWTH06; 10.1016/j.cpc.2006.06.013 ADVL_v2_1; GROWTH06_v2; 10.1016/j.cpc.2009.01.024 ADVL_v3_0; Growth09; 10.1016/j.cpc.2009.11.011 ADVL_v4_0; GrowthCP; 10.1016/j.cpc.2011.02.014 This program has been imported from the CPC Program Library held at Queen's University Belfast (1969-2018)</description><subject>Computer Graphics</subject><subject>Computer Hardware</subject><subject>Software</subject><subject>Surface Science</subject><subject>Condensed Matter Physics</subject><subject>Crystallography</subject><subject>Programming Languages</subject><subject>Computational Physics</subject><subject>Computational Method</subject><contributor>Daniluk, Andrzej</contributor><type>Other:Dataset</type><identifier>10.17632/6rh8wtbrvm.1</identifier><rights>Computer Physics Communications Journal Licence</rights><rights>https://www.elsevier.com/about/policies/open-access-licenses/elsevier-user-license/cpc-license/</rights><relation>https:/data.mendeley.com/datasets/6rh8wtbrvm</relation><date>2010-03-01T12:00:00Z</date><recordID>0.17632-6rh8wtbrvm.1</recordID></dc>
format Other:Dataset
Other
author CPC, Mendeley
author2 Daniluk, Andrzej
title Model-Driven Development for scientific computing. Computations of RHEED intensities for a disordered surface. Part II
publisher Mendeley
publishDate 2010
topic Computer Graphics
Computer Hardware
Software
Surface Science
Condensed Matter Physics
Crystallography
Programming Languages
Computational Physics
Computational Method
url https:/data.mendeley.com/datasets/6rh8wtbrvm
contents Abstract Modelling, simulation, and visualisation together create the third branch of human knowledge on equal footing with theory and experiment. Model-Driven Development (MDD) has been proposed as a means to support the software development process through the use of a model-centric approach. The objective of this paper is to address the design of an architecture for scientific application that may execute as multithreaded computations, as well as implementations of the related shared data structure... Title of program: Growth09 Catalogue Id: ADVL_v3_0 Nature of problem Molecular beam epitaxy (MBE) is a technique for epitaxial growth via the interaction of one or several molecular or atomic beams that occurs on a surface of a heated crystalline substrate. Reflection high-energy electron diffraction (RHEED) is an important in situ analysis technique, which is capable of giving quantitative information about the growth process of thin films and its control. The analysis of RHEED intensity oscillations has two purposes. One is to control the film growth, and the o ... Versions of this program held in the CPC repository in Mendeley Data ADVL_v1_0; GROWTH; 10.1016/j.cpc.2005.04.005 ADVL_v2_0; GROWTHgr, GROWTH06; 10.1016/j.cpc.2006.06.013 ADVL_v2_1; GROWTH06_v2; 10.1016/j.cpc.2009.01.024 ADVL_v3_0; Growth09; 10.1016/j.cpc.2009.11.011 ADVL_v4_0; GrowthCP; 10.1016/j.cpc.2011.02.014 This program has been imported from the CPC Program Library held at Queen's University Belfast (1969-2018)
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