IEEE TRANSACTIONS ON INSTRUMENTATION AND MEASUREMENT: A PUBLICATION OF THE IEEE INSTRUMENTATION AND MEASUREMENT SOCIETY, VOL.55, NO.5, OCTOBER 2006.

Main Authors: T. Addabo, M. Alioto, A. Fort, S. Rocchi, And V. Vignoli, R. Anchini, C. Liguori, V. Paciello, And A. Paolillo, G. Andria, F. Attivismo, N. Giaquinto, A. M. L. Lanzolla, L. Quagliarella, And N. Sasanelli, L. Angrisani, L. Angrisani, I. Ghiidini, And M. Vadursi, J. Barros And E. Perez, M. Bertocco, And A. Sona, G. Betta, D. Capriglione, And M. Laracca, P. Boets, T. Bostoen, L. Van Biesen, And T. Pollet, W. Buller And B. Wilson, D.L. Carni, D. Grimaldi, And L. Serratore, S. Corbellini, F. Ferraris, And M. Parvis, D. Dallet, D. Slepicka, Y. Berthoumieu, D. Haddadi, And P. MarchegayIlmu Hukum, A. Das, R. Bag, And N.G. Nath, F. Davoli, G. Spano, S. Vignola, And S. Zappatore, S. De Capitani Di Vimercati, A. Ferrero, And M. Lazzarone, G.De Graaf And R.F. Wolffenbuttel, J.M. Diamond, F. Dong, Y. Xu, L. Hua, And H. Wang, D. Zhang And D. Lonescu
Format: Book
Terbitan: THE INSTITUTE OF ELECTRICAL AND ELECTRONICS ENGINEERS,Inc , 2006
Subjects:
620
Online Access: http://digilib.ubl.ac.id:80/index.php?p=show_detail&id=15460