IDDQ TESTING FOR DETECTING RESISTIVE OPEN DEFECTS IN HCMOS LOGIC ICS
| Main Authors: | Widianto, Widianto, Syafaah, Lailis, Nurhadi, Nurhadi |
|---|---|
| Format: | Book PeerReviewed |
| Bahasa: | eng |
| Terbitan: |
Fakultas Teknik Universitas Muhammadiyah Malang
, 2017
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| Subjects: | |
| Online Access: |
http://eprints.umm.ac.id/59715/1/Widianto%20Syafaah%20Nurhadi-resistive%20open%20defects%20HCMOS%20IC%20IDDQ%20testing%20defective%20IC.pdf http://eprints.umm.ac.id/59715/2/Peer%20Review-Widianto-resistive%20open%20defects%20HCMOS%20IC%20IDDQ%20testing%20defective%20IC.pdf http://eprints.umm.ac.id/59715/18/Similarity%20-%20Widianto%20Syafaah%20Nurhadi%20-%20resistive%20open%20defects%20HCMOS%20IC%20IDDQ%20testing%20defective%20IC.pdf http://eprints.umm.ac.id/59715/ http://research-report.umm.ac.id/index.php/sentra/article/view/1494 |