Semiconductor measurements and instrumentation

Main Authors: Runyan,W.R., Shaffner, T.J.
Format: Book
Bahasa: ind
Terbitan: McGraw-Hill , 1997
Subjects:
Online Access: http://opac.unila.ac.id//index.php?p=show_detail&id=90453
Daftar Isi:
  • Indeks .hlm.:441 -453
  • x, 453 hlm. : il. ; 23 cm.