Atom Indonesia Vol. 35, No. 1, January 2009 Surface Roughness And Grain Size Characterization Of Effect Of Annealing Temperature For Growth Gallium And Tantalum Doped Ba0.5 Sr0.5 TiO3 Thin Film
| Main Authors: | Irzaman, H. Darmasetiawan, Hardhienata |
|---|---|
| Format: | |
| Bahasa: | eng |
| Terbitan: |
National Nuclear Energy Agency of Indonesia
, 2009
|
| Online Access: |
http://katalog.pustaka.unand.ac.id//index.php?p=show_detail&id=88627 |
Daftar Isi:
- Hal. 57-66.;23 cm