Penentuan sifat-sifat optik ion pada sistem analisis massa untuk spektrometer massa=Determination of the Optical Properties of Ions in the MassAnalysis System of a Mass Spectrometer
| Main Author: | Perpustakaan UGM, i-lib |
|---|---|
| Format: | Article NonPeerReviewed |
| Terbitan: |
[Yogyakarta] : Universitas Gadjah Mada
, 1988
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| Subjects: | |
| Online Access: |
https://repository.ugm.ac.id/23272/ http://i-lib.ugm.ac.id/jurnal/download.php?dataId=6215 |
Daftar Isi:
- ABSTRACT Investigation on the ion optical properties of homogeneous magnetic sector field has been carried out by employing two approximation methods: the Sharp CutoffFringing Field (SCOFF) and the Extended Fringing Field (EFF). In the SCOFF approximation, the influence of fringing field was neglected. The SCOFF and EFF methods were equal in radial focusing but unequal in axial focusing as shown by comparing the results of the calculation using these two methods. The stigmatic focusing condition at oblique incidence and exit for the main path was derived in the radial and the axial directional focusing when the normalization image distance was equal to 2 and the angle of obliqueness e = 26,5°, while the angle of the magnetic sector O. = 90°. At this condition, the mass dispersion D. was enhanced by a factor of2 compared to its value at normal incidence, thereby increasing the mass resolving power from its value at normal incidence. Key words: ion optic - fringing field - stigmatic focusing