UJI LINEAR- SHIFT INVARIANT SISTEM MIKRORADIOGRAFI SINAR-X DIGITAL
| Main Authors: | , NURUL HIDAYAH SAM, , Dr. Gede Bayu Suparta |
|---|---|
| Format: | Thesis NonPeerReviewed |
| Terbitan: |
[Yogyakarta] : Universitas Gadjah Mada
, 2014
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| Subjects: | |
| Online Access: |
https://repository.ugm.ac.id/130337/ http://etd.ugm.ac.id/index.php?mod=penelitian_detail&sub=PenelitianDetail&act=view&typ=html&buku_id=70757 |
Daftar Isi:
- Research testing on the digital X-ray microradiography imaging system developed by the Grup Riset Fisika Citra�Universitas Gadjah Mada (UGM GRFC) had been conducted. A pinhole testing object was used to determine the Linear Shift Invariant (LSI) characteristic of digital X-rays microradiography imaging system in the initial testing phase. It has 5 cm circular holes diameter filled with 0.4 mm diameter holes spaced 1.5 mm. Then original image obtained was corrected with the Gaussian curve fitting method. The corrected image was compared with the original image based on the line profile and Full Width at Half Maximum (FWHM) value using ImageJ software and Matlab7. The results showed that corrected image had a linear intensity distribution value compared the original image. However, the response distribution of spatial resolution was slightly uneven at the point of angel position. Based on the results obtained by analysising the corrected image, the nature of the digital X-ray microradiography imaging system was non - Linear Shift Invariant (LSI). Thus, a pinhole testing object and Gaussian correction method can be applied to analyze and correct the imaging system so that the output response becomes Linear Shift - Invariant (LSI).