KARAKTERISASI SIFAT OPTIK DAN MORFOLOGI NANOROD ZnO YANG DIDOPING GALIUM (ZnO;Ga)

Main Authors: Novita, Sri, Iwantono, Iwantono, Awidrus, Awidrus
Format: Article info application/pdf eJournal
Bahasa: eng
Terbitan: Komunikasi Fisika Indonesia , 2017
Subjects:
Online Access: http://ejournal.unri.ac.id/index.php/JKFI/article/view/4332
http://ejournal.unri.ac.id/index.php/JKFI/article/view/4332/4155
Daftar Isi:
  • ZnO nanorods have been successfully grown on the surface of FTO (Fluorine Tin Oxide)byhydrothermal method at a temperature of 90 ° C for 8 hours. In this study,It will be analyzed theeffect of percentage variation of gallium at 0%, 0.5%, 1%, 1.5%, 2%, 2.5% and 3% to the opticaland morphological properties of the grown ZnO nanorods. The samples were analyzed usingUV-Vis spectroscopy and Field Emission Scanning Microscope (FESEM). The UV- Vis spectrashowed that the strong reflectance observed at the wavelength of 400-800 nm. The 2.5% Gadoped ZnO was the lowest reflectance compared to other samples. The FESEM images showedthat gallium doped ZnO nanorods grew ontothe surface FTO with hexagonal face shape. It wasalso observed that the 2.5% doped Ga sample was the most uniform and formed verticalorientation array.