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Evaluation of Majority Charge Carrier and Impurity Concentration Using Hot Probe Method for Mono Crystalline Silicon (100) Wafer

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Main Authors: Nahid Akter, Sajia Afrin, Md Abul Hossion, Md. Alamgir Kabir, Shirin Akter, Zahid Hasan Mahmood
Format: Article
Terbitan: , 2015
Subjects:
Hot probe
Carrier concentration
Silicon wafer
Hole mobility
Diffusion Coefficient
Online Access: https://zenodo.org/record/4020029
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https://zenodo.org/record/4020029

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