Oxide Based Resistive Random Access Memory Device for High Density Non Volatile Memory Applications

Main Authors: Z. Fang, X. P. Wang, G. Q. Lo, D. L. Kwong
Format: Article Journal
Bahasa: eng
Terbitan: , 2013
Online Access: https://zenodo.org/record/1335656
Daftar Isi:
  • In this work, we demonstrated vertical RRAM device fabricated at the sidewall of contact hole structures for possible future 3-D stacking integrations. The fabricated devices exhibit polarity dependent bipolar resistive switching with small operation voltage of less than 1V for both set and reset process. A good retention of memory window ~50 times is maintained after 1000s voltage bias.