Tunneling atomic force microscopy characterization of cuprous oxide thin films
| Main Authors: | Castle, Brett, Li, Alex, Coutu, Ron, Hengehold, Robert, Van Nostrand, Joseph |
|---|---|
| Format: | Proceeding Journal |
| Terbitan: |
, 2011
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| Online Access: |
https://zenodo.org/record/1277105 |
Internet
https://zenodo.org/record/1277105Lokasi
| Koleksi | Cognizance Journal of Multidisciplinary Studies |
|---|---|
| Gedung | Cognizance Journal of Multidisciplinary Studies |
| Institusi | ZAIN Publications |
| Kota | Stockholm |
| Provinsi | INTERNASIONAL |
| Kontak | Butuh informasi lebih lanjut? Hubungi pustakawan institusi ini. |