Tunneling atomic force microscopy characterization of cuprous oxide thin films
| Main Authors: | Castle, Brett, Li, Alex, Coutu, Ron, Hengehold, Robert, Van Nostrand, Joseph |
|---|---|
| Format: | Proceeding Journal |
| Terbitan: |
, 2011
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| Online Access: |
https://zenodo.org/record/1277105 |
Daftar Isi:
- n/a