Effects of interface-trapped charge on the SiC MOSFET characteristics

Main Authors: Scozzi, C. J., McGarrity, J. M.
Format: Proceeding Journal
Terbitan: , 1970
Online Access: https://zenodo.org/record/1269305

Internet

https://zenodo.org/record/1269305

Lokasi

Koleksi Cognizance Journal of Multidisciplinary Studies
Gedung Cognizance Journal of Multidisciplinary Studies
Institusi ZAIN Publications
Kota Stockholm
Provinsi INTERNASIONAL
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