Effects of interface-trapped charge on the SiC MOSFET characteristics
| Main Authors: | Scozzi, C. J., McGarrity, J. M. |
|---|---|
| Format: | Proceeding Journal |
| Terbitan: |
, 1970
|
| Online Access: |
https://zenodo.org/record/1269305 |
Daftar Isi:
- n/a