Stress analysis of anodic bonded wafer after CMP process

Main Authors: Sim, Sung-min, Lee, Yeonsu, Kang, Hye-Lim, Hwang, Y.S., Park, C.H., Llamas-Garro, Ignacio, Kim, Jung-Mu
Format: Proceeding Journal
Bahasa: eng
Terbitan: , 2017
Subjects:
Online Access: https://zenodo.org/record/1002109

Internet

https://zenodo.org/record/1002109

Lokasi

Koleksi Cognizance Journal of Multidisciplinary Studies
Gedung Cognizance Journal of Multidisciplinary Studies
Institusi ZAIN Publications
Kota Stockholm
Provinsi INTERNASIONAL
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