IEEE TRANSACTIONS ON INSTRUMENTATION AND MEASUREMENT: A PUBLICATION OF THE IEEE INSTRUMENTATION AND MEASUREMENT SOCIETY, VOL.55, NO.3, JUNE 2006

oleh A. Ferrero, - S. Salicone And Tinarelli, J. Wirandi, A. Lauber, Amd W. J. Kulesza, A. Ferrero And S. Salicone, M. Brandner And T. Thurner, A. Denguir-Rekik, H. Mauris, And J. Montmain, T.E. Lovett, F. Ponci, And A. Monti, L. Angrisani, M. D’apuzzo, And R. S. Lo Moriello, O. Andrisano, A. Conti, D. Dardari, And A. Roversi, D. Baderna, A. Cabrini. And G. Torelli, S. Baglio And N. Savalli, E. Bennoit, A. Chovin, L. Fuolloy, A. Chatenay, And G. Mauris, S.C. Bera, J.K. Ray, And S. Chattopadhyay, A. Bermak And S.B. Belhouari, D.V. Bhatt, S. Schulze, And G.P. Hancke
Terbitan: THE INSTITUTE OF ELECTRICAL AND ELECTRONICS ENGINEERS,Inc, 2006

IEEE TRANSACTIONS ON INSTRUMENTATION AND MEASUREMENT: A PUBLICATION OF THE IEEE INSTRUMENTATION AND MEASUREMENT SOCIETY, VOL.55, NO.4, AUGUST 2006

oleh R.A Goubran And V.Z. Groza, A.R. Abu-El-Quran, R. A. Goubran, And A. D. C. Chan, N. N. Almoayed And M.N. Afsar, F. Amigoni, A. BraF. Amigoni, A. Brandolini, V.Caglioti, V. Di Lecce, A. Guerriero, M. Lazzaroni, F., L. Angrisani, M. D’ ApL. Angrisani, M. D’ Apuzzo, And M. Vadursiuzzo, And M. Vadursi, L. Angrisani, R.S. Lo Moriello, And M. D’ Apuzzo, L. Angrisani, G. Ventre,, L. Peluso, And A. Tedesco, L. Angrisani, A. Baccigalupi, And R.S. Lo Moriello, R. Azaro, G. Bozza, C.R. Azaro, G. Bozza, C. Estatico, A. Massa, M. Pastorino, D. Pregnolato, And A., D.I. Bergman And G.N. Stenbakken, C. Bes, G. Plantier, And T. Bosch, S.Biswas, S.R. Das, And E.M. Petriu, W.J. Bock, J .Chen, T. Eftimov, And W. Urbanczyk, P.M.T. Broersen And R. Bos
Terbitan: THE INSTITUTE OF ELECTRICAL AND ELECTRONICS ENGINEERS,Inc, 2006

Transactions On Instrumentation And Measurement: A Publication Of The IEEE Instrumentation And Measurement Society, Vol.52, No.4, August 2003

oleh A.J. Lopez-Martin, S. de Waele, A. Ferrero, A. Fort, L. Dziuda, S. Salicone, J. Schoukens, C.E Lin, M.J. Niemann, V. H. Hans, J.L. De la Rosa, G. Fleury, M. -E. Davoust, Y. Rolain, G. Simon, R. Pinton, A. Geens, W. Von Moer, N. Tadic, D. Gobovic, Q. Wang, Y Shen, Y. Zhang, J.Q. Zhang, M.Bertocco, R. Tittoto, E. Rizzi, l. Benetazzo, P.M.T. Broersen, M. D'Arco, C.-C.Li, A.-S. Hou, C.C. Wu, C. Muscas, S. Rocchi, J. I. Osa, M. Zusa, A. Carlosena, L.Cristaldi, R. Tinarelli, C. Di Nucci, L. Tondi. V. Vignoli, F. Di Francesco, M. B.Serrano Santos, B. Schweighofer, K. M. Raab, G. Brasseur, P. Niewczas, L. Angrisani. M. D'Apuzzo, B. C. Waltrip, M. Solomou, A. Anopchenko, H. Zhang, L. Yang
Terbitan: IEEE, 2003