A comparative study of epitaxial InGaAsBi/InP structures using Rutherford Backscattering Spectrometry, X-ray diffraction and Photoluminescence techniques

oleh Matthew Sharpe, Dr Igor Marko, Dominic Duffy, Jonathan England, E. Schneider, M. Kesaria, V. Fedorov, E. Clarke, C. H. Tan, Stephen Sweeney
Terbitan: 2019