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Hikam, M.; Department of Physics, FMIPA UI, UI Campus Depok, Indonesia – 17000
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Title
Surface Roughness and Grain Size Characterization of Annealing Temperature Effect For Growth Gallium and Tantalum Doped Ba0.5 Sr0.5TiO3Thin Film
Article
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"application/pdf"
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oleh
Irzaman, Irzaman; Department of Physics, FMIPA Bogor Agricultural Unversity (BAU), BAU Campus Darmaga Gedung Wing S Bogor, Indonesia – 16680
,
Darmasetiawan, H.; Department of Physics, FMIPA Bogor Agricultural Unversity (BAU), BAU Campus Darmaga Gedung Wing S Bogor, Indonesia – 16680
,
Hardhienata, H.; Department of Physics, FMIPA Bogor Agricultural Unversity (BAU), BAU Campus Darmaga Gedung Wing S Bogor, Indonesia – 16680
,
Hikam
,
M
.;
Department
of
Physics
,
FMIPA
UI
,
UI
Campus
Depok
,
Indonesia
–
17000
,
Arifin, P.; Department of Physics, FMIPA ITB, Jalan Ganesa 10 Bandung, Indonesia – 40132
,
Jusoh, S.N.; School of Microelectronic Engineering, Universiti Malaysia Perlis, Jalan Bukit Lagi, 01000 Kangar Perlis, Malaysia.
,
Taking, S.; School of Microelectronic Engineering, Universiti Malaysia Perlis, Jalan Bukit Lagi, 01000 Kangar Perlis, Malaysia.
,
Jamal, Z.; School of Microelectronic Engineering, Universiti Malaysia Perlis, Jalan Bukit Lagi, 01000 Kangar Perlis, Malaysia.
,
Idris, M.A.; School of Material Engineering, Universiti Malaysia Perlis, Jalan Bukit Lagi, 01000 Kangar Perlis, Malaysia
Terbitan:
PPIKSN-BATAN, 2011
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Related Subjects
AFM
BGST
BTST
CSD method
grain size
roughness
thin films
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