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Bibhudutta Rout
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Investigation of the Saturation of Elemental Concentration in the Depth Profile of Low Energy Silver Ion Implants in Silicon
Article
info
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application/pdf
oleh
Mangal S. Dhoubhadel
,
Bibhudutta
Rout
,
Wick Ramaarachchige J. Lakshantha
,
Floyd D. Mcdaniel
Terbitan:
Chitkara University Publications, 2016
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Redistribution of Nickel Ions Embedded within Indium Phosphide Via Low Energy Dual Ion Implantations
Article
info
Book
application/pdf
oleh
Daniel C. Jones
,
Joshua M. Young
,
Wickramaarachchige J. Lakshantha
,
Satyabrata Singh
,
Todd A. Byers
,
Duncan L. Weathers
,
Floyd D. McDaniel
,
Bibhudutta
Rout
Terbitan:
Chitkara University Publications, 2018
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Related Subjects
Ag nanoclusters
Dual Ion Implantations
InP based optoelectronics devices
Ni nanoclusters
RBS
Rutherford Backscattering
X-ray Photoelectron Spectroscopy
XPS
depth profile
ion implantation
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