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Investigation of Structural Parameter Variation on Extended Gate TFET for Bio-Sensor Applications
Article info application/pdf eJournal
oleh Mukherjee, Sudipta; Indian Institute of Technology, Chakraborty, Somnath; Indian Institute of Technology Bombay, Diwakar, Deven; Indian Institute of Technology Bombay, Laha, Apurba; Indian Institute of Technology Bombay, Ganguly, Udayan; Indian Institute of Technology Bombay, Ganguly, Swaroop; IIT Bombay
Terbitan: IAES Indonesia Section, 2020
Institusi: IAES Indonesia Section and Partners
Gedung: IAES Indonesia Section and Partners
Lokasi Repository IOS Number
KOTA YOGYAKARTAProceeding of the Electrical Engineering Computer Science and InformaticsIOS2397.article-2058
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Topik: Structural Parameter Variation
Sektor
1 Library University 1
Institusi
1 IAES Indonesia Section and Partners
Koleksi
1 Proceeding of the Electrical Engineering Computer Science and Informatics
Format
1 File Application/pdf 1 1 Journal Article 1 EJournal 1 1 Other Info 1 less ...
Topik
1 Bio-Sensor 1 FG-DMTFET 1 Label-free Detection 1 On-current Improvement 1 Sensitivity Structural Parameter Variation
Pengarang
1 Chakraborty, Somnath; Indian Institute of Technology Bombay 1 Diwakar, Deven; Indian Institute of Technology Bombay 1 Ganguly, Swaroop; IIT Bombay 1 Ganguly, Udayan; Indian Institute of Technology Bombay 1 Laha, Apurba; Indian Institute of Technology Bombay 1 Mukherjee, Sudipta; Indian Institute of Technology
Bahasa
1 eng
Tahun
1 2020
Penerbit
1 IAES Indonesia Section

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