1 DEFAULT 1 Universitas Bandar Lampung

1 DEFAULT 1 OPAC Perpustakaan Universitas Bandar Lampung

1 Book Book 1

1 620 1 A Bayesian Approach 1 A Built-In-Test Scheme 1 A Chirp-Z Transform-Based Synchronizer 1 Automated Selection 1 Built In Online And Offline Test more ... 1 Built-In Self-Test 1 Catch Themselves-Self-Testing 1 Characterization Of Threshold-Induced Phenomena 1 Deterministic Driven Devices 1 Diagnosis And Prognosis 1 Effective Simulation Of Signals Embedded Ttest Control Schemes 1 Evaluating The Parameters 1 Getting Errors 1 Phase-Locked Loops 1 SOCs 1 Special Issue On Bit CMOS Built-In Test Architectu 1 Test Frequencies 1 Testing ECG Analyzer 1 VLSI Circuits 1 iBIST less ...

1 A. Cataliotti 1 A. Chong 1 A. Fort 1 A. Josko 1 A.S. Hou 1 B. Ando more ... 1 B. Nelson 1 C. Alippi, 1 C.-L. Hsu 1 D. Kay 1 E. Chan 1 H. Haggag 1 H. Lin 1 J. Braatz 1 J. Huard 1 J. Savir 1 J.W. Sheppard 1 K.A. Taylor 1 M. Aiello 1 M. Catelani 1 M. Mugnaini 1 M. Soma 1 M.A. Kaufman 1 P. Pitrone 1 R.J. Rak 1 R.X. Gao 1 S. Graziano 1 S. Mourad 1 S. Nuccio 1 S.-W. Wang 1 S.Chung 1 S.R. Das 1 Y. Lai less ...

1 2005

1 THE INSTITUTE OF ELECTRICAL AND ELECTRONICS ENGINEERS,Inc