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topic_facet:"Built-in self-test"
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A review paper on memory fault models and test algorithms
Article
Journal
oleh
Aiman Zakwan Jidin
,
Razaidi Hussin
,
Lee Weng Fook
,
Mohd Syafiq Mispan
Terbitan:
2021
Institusi:
ZAIN Publications
Gedung:
Cognizance Journal of Multidisciplinary Studies
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Stockholm
Cognizance Journal of Multidisciplinary Studies
IOS16997.5909142
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Topik: Built-in self-test
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ZAIN Publications
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Cognizance Journal of Multidisciplinary Studies
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Built-in self-test
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Design for testability
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March test algorithm
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Memory fault model
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Random access memory
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Aiman Zakwan Jidin
1
Lee Weng Fook
1
Mohd Syafiq Mispan
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Razaidi Hussin
Tahun
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2021
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