Lokasi: Surface Roughness and Grain Size Characterization of Annealing Temperature Effect For Growth Gallium and Tantalum Doped Ba0.5 Sr0.5TiO3Thin Film

Main Authors:	Irzaman, Irzaman; Department of Physics, FMIPA Bogor Agricultural Unversity (BAU), BAU Campus Darmaga Gedung Wing S Bogor, Indonesia – 16680, Darmasetiawan, H.; Department of Physics, FMIPA Bogor Agricultural Unversity (BAU), BAU Campus Darmaga Gedung Wing S Bogor, Indonesia – 16680, Hardhienata, H.; Department of Physics, FMIPA Bogor Agricultural Unversity (BAU), BAU Campus Darmaga Gedung Wing S Bogor, Indonesia – 16680, Hikam, M.; Department of Physics, FMIPA UI, UI Campus Depok, Indonesia – 17000, Arifin, P.; Department of Physics, FMIPA ITB, Jalan Ganesa 10 Bandung, Indonesia – 40132, Jusoh, S.N.; School of Microelectronic Engineering, Universiti Malaysia Perlis, Jalan Bukit Lagi, 01000 Kangar Perlis, Malaysia., Taking, S.; School of Microelectronic Engineering, Universiti Malaysia Perlis, Jalan Bukit Lagi, 01000 Kangar Perlis, Malaysia., Jamal, Z.; School of Microelectronic Engineering, Universiti Malaysia Perlis, Jalan Bukit Lagi, 01000 Kangar Perlis, Malaysia., Idris, M.A.; School of Material Engineering, Universiti Malaysia Perlis, Jalan Bukit Lagi, 01000 Kangar Perlis, Malaysia
Other Authors:	National Nuclear Energy Agency of Indonesia
Format:	Article info "application/pdf" eJournal
Bahasa:	eng
Terbitan:	PPIKSN-BATAN , 2011
Subjects:	BGST BTST thin films CSD method AFM roughness grain size
Online Access:	http://aij.batan.go.id/index.php/aij/article/view/48 http://aij.batan.go.id/index.php/aij/article/view/48/35

Koleksi	Atom Indonesia Journal
Gedung	Perpustakaan Badan Tenaga Nuklir Nasional
Institusi	Badan Tenaga Nuklir Nasional
Kota	JAKARTA SELATAN
Provinsi	DKI JAKARTA
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