Lee Chin, R. (2020). Data for: Detailed Analysis of Radiative Defects in n-type Float-Zone Silicon using Temperature- and Light Intensity-Dependent Spectral Photoluminescence. Mendeley.
Chicago Style CitationLee Chin, Robert. Data For: Detailed Analysis of Radiative Defects in N-type Float-Zone Silicon Using Temperature- and Light Intensity-Dependent Spectral Photoluminescence. Mendeley, 2020.
MLA CitationLee Chin, Robert. Data For: Detailed Analysis of Radiative Defects in N-type Float-Zone Silicon Using Temperature- and Light Intensity-Dependent Spectral Photoluminescence. Mendeley, 2020.
Warning: These citations may not always be 100% accurate.