zhang, x. (2020). Data for: High-quality, high-throughput cryo-electron microscopy data collection via beam tilt and astigmatism-free beam-image shift. Mendeley.
Chicago Style Citationzhang, xinzheng. Data For: High-quality, High-throughput Cryo-electron Microscopy Data Collection Via Beam Tilt and Astigmatism-free Beam-image Shift. Mendeley, 2020.
MLA Citationzhang, xinzheng. Data For: High-quality, High-throughput Cryo-electron Microscopy Data Collection Via Beam Tilt and Astigmatism-free Beam-image Shift. Mendeley, 2020.
Warning: These citations may not always be 100% accurate.