Lokasi: IEEE TRANSACTIONS ON INSTRUMENTATION AND MEASUREMENT: A PUBLICATION OF THE IEEE INSTRUMENTATION AND MEASUREMENT SOCIETY, VOL.55, NO.2, APRIL 2006

Main Authors:	J. Di, H. Li, R. Rajsuman, R. Schiano Lo Moriello, A. Carullo, M. Parvis, A. Vallan, R. Tittoto, l. Benetazzo, A. Baccigalupi, S. R. Das, J.-Y Ryu, B. C. Kim, I. Sylla, Y. Han, X Li, A. Chandra, M.-K. Chen, C-C. Tai, Y.-J Huang, D. P Vasudevan, P .K. Lala, J. P. Parkerson, R. X. Gao, Z. Fan, C. Affolderbach, , F Droz, G. Mileti, E. Angelini, , F Ferraris, V. Gallone, S. Grassini, L. Angrisani,, P A. Pegoraro, W. J. Burger, G. Crupi, N. Donato
Format:	Book
Terbitan:	THE INSTITUTE OF ELECTRICAL AND ELECTRONICS ENGINEERS,Inc , 2006
Subjects:	Reduce Required Tester Channels A Measurement Method Embedded Test Resource Handheld-Impedance-Measurement System New Low-Cost RF Built-In Self-Test Measurement Experimental Demonstration of a Compact and High-P VLSI Testing-Future of Semiconductor Test Sensory Node Controller Architectural Design Online Testability Metrological Management of Large-Scale Measuring S Reversible-Logic Design Spaceborne Particle Detection Nondestructive Analysis of Interconnection in Two- Passive Measurement Tool 620
Online Access:	http://digilib.ubl.ac.id:80/index.php?p=show_detail&id=15478