IEEE TRANSACTIONS ON INSTRUMENTATION AND MEASUREMENT: A PUBLICATION OF THE IEEE INSTRUMENTATION AND MEASUREMENT SOCIETY, VOL.53, NO.6, DECEMBER 2004.

Main Authors: H. Baili, G.A Fleury, F. Bicking, B. Conrard, J.-M. Thiriet, M. Choi, N. Park, V. Piuri, F. Lombardi, X. Fang, D. Linton, C. Walker, B. Collins, G.C. Giacos, S. Suryanarayanan, R. Guntupali, J. Odogba, N.Shah, S. Vedanthan, S. Chowdhury, K. Meht, J. Guo, W. Law, W.J. Helms, And D.J. Allstot, C.V.K. Kandala,, O. Kanoun And H.-R. Trankler, J.S. Lee, C. Nguyen, And T. Scullion`, S.L. Lin And S. S.L. Lin And S. Mourad, A. Malhi And R.X. Gao, G.J. Schuster, S.R. Doctor, And L.J. Bond, M. Shinagawa, M. Fukutomo, K. Ochiai And H. Kyuragi, L. Xu, J.Q. Zhang And Y. Yan
Format: Book
Terbitan: , 2004
Subjects:
Com
Ult
620
Online Access: http://digilib.ubl.ac.id:80/index.php?p=show_detail&id=15455