Cross Sectional TEM Characterization of Epitaxial Silicon Film Grown using Hot Wire Chemical Vapor Deposition
| Main Authors: | M. Abul Hossion, Brij. M. Arora |
|---|---|
| Format: | Article Journal |
| Terbitan: |
, 2020
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| Subjects: | |
| Online Access: |
https://zenodo.org/record/4020477 |
Internet
https://zenodo.org/record/4020477Lokasi
| Koleksi | Cognizance Journal of Multidisciplinary Studies |
|---|---|
| Gedung | Cognizance Journal of Multidisciplinary Studies |
| Institusi | ZAIN Publications |
| Kota | Stockholm |
| Provinsi | INTERNASIONAL |
| Kontak | Butuh informasi lebih lanjut? Hubungi pustakawan institusi ini. |