Effect of Thickness on Structural and Electrical Properties of CuAlS2 Thin Films Grown by Two Stage Vacuum Thermal Evaporation Technique
| Main Authors: | A. U. Moreh, M. Momoh, H. N. Yahya, B. Hamza, I. G. Saidu, S. Abdullahi |
|---|---|
| Format: | Article |
| Bahasa: | eng |
| Terbitan: |
, 2014
|
| Online Access: |
https://zenodo.org/record/2840141 |