Effect of Thickness on Structural and Electrical Properties of CuAlS2 Thin Films Grown by Two Stage Vacuum Thermal Evaporation Technique
Main Authors: | A. U. Moreh, M. Momoh, H. N. Yahya, B. Hamza, I. G. Saidu, S. Abdullahi |
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Format: | Article |
Bahasa: | eng |
Terbitan: |
, 2014
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Online Access: |
https://zenodo.org/record/2664382 |