A Spatial Point Pattern Analysis to Recognize Fail Bit Patterns in Semiconductor Manufacturing
| Main Authors: | Youngji Yoo, Seung Hwan Park, Daewoong An, Sung-Shick Kim, Jun-Geol Baek |
|---|---|
| Format: | Article Journal |
| Bahasa: | eng |
| Terbitan: |
, 2014
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| Online Access: |
https://zenodo.org/record/2658992 |
Internet
https://zenodo.org/record/2658992Lokasi
| Koleksi | Cognizance Journal of Multidisciplinary Studies |
|---|---|
| Gedung | Cognizance Journal of Multidisciplinary Studies |
| Institusi | ZAIN Publications |
| Kota | Stockholm |
| Provinsi | INTERNASIONAL |
| Kontak | Butuh informasi lebih lanjut? Hubungi pustakawan institusi ini. |