Radiation-Induced Interface Traps in Power Mosfets
| Main Authors: | Singh, Gurbax, Galloway, Kenneth F., Russell, Thomas J. |
|---|---|
| Format: | Article Journal |
| Terbitan: |
, 1986
|
| Online Access: |
https://zenodo.org/record/1282232 |
Internet
https://zenodo.org/record/1282232Lokasi
| Koleksi | Cognizance Journal of Multidisciplinary Studies |
|---|---|
| Gedung | Cognizance Journal of Multidisciplinary Studies |
| Institusi | ZAIN Publications |
| Kota | Stockholm |
| Provinsi | INTERNASIONAL |
| Kontak | Butuh informasi lebih lanjut? Hubungi pustakawan institusi ini. |