Investigation of Multiple Material Gate Impact on Short Channel Effects and Reliability of Nanoscale SOI MOSFETs
| Main Authors: | Paniz Tafakori, Ali A. Orouji |
|---|---|
| Format: | Article |
| Bahasa: | eng |
| Terbitan: |
, 2013
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| Subjects: | |
| Online Access: |
https://zenodo.org/record/1077974 |