Yield Prediction Using Support Vectors Based Under-Sampling in Semiconductor Process

Main Authors: Sae-Rom Pak, Seung Hwan Park, Jeong Ho Cho, Daewoong An, Cheong-Sool Park, Jun Seok Kim, Jun-Geol Baek
Format: Article Journal
Bahasa: eng
Terbitan: , 2012
Subjects:
Online Access: https://zenodo.org/record/1061384

Internet

https://zenodo.org/record/1061384

Lokasi

Koleksi Cognizance Journal of Multidisciplinary Studies
Gedung Cognizance Journal of Multidisciplinary Studies
Institusi ZAIN Publications
Kota Stockholm
Provinsi INTERNASIONAL
Kontak Butuh informasi lebih lanjut? Hubungi pustakawan institusi ini.