Yield Prediction Using Support Vectors Based Under-Sampling in Semiconductor Process
Main Authors: | Sae-Rom Pak, Seung Hwan Park, Jeong Ho Cho, Daewoong An, Cheong-Sool Park, Jun Seok Kim, Jun-Geol Baek |
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Format: | Article Journal |
Bahasa: | eng |
Terbitan: |
, 2012
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Subjects: | |
Online Access: |
https://zenodo.org/record/1061384 |
Internet
https://zenodo.org/record/1061384Lokasi
Koleksi | Cognizance Journal of Multidisciplinary Studies |
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Gedung | Cognizance Journal of Multidisciplinary Studies |
Institusi | ZAIN Publications |
Kota | Stockholm |
Provinsi | INTERNASIONAL |
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