A Soft Error Study on Tri-gate based FinFET and Junctionless-FinFET 6T SRAM Cell – A Comparison
| Main Authors: | Chitra, P; VIT University, Ravi, S; VIT UNIVERSITY, Ramakrishnan, V N; VIT UNIVERSITY |
|---|---|
| Other Authors: | VIT University |
| Format: | Article info eJournal |
| Bahasa: | eng |
| Terbitan: |
Universitas Ahmad Dahlan
, 2016
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| Subjects: | |
| Online Access: |
http://journal.uad.ac.id/index.php/TELKOMNIKA/article/view/3458 |
Internet
http://journal.uad.ac.id/index.php/TELKOMNIKA/article/view/3458Lokasi
| Koleksi | Bulletin of Electrical Engineering and Informatics |
|---|---|
| Gedung | Perpustakaan Universitas Ahmad Dahlan |
| Institusi | Universitas Ahmad Dahlan |
| Kota | KOTA YOGYAKARTA |
| Provinsi | DAERAH ISTIMEWA YOGYAKARTA |
| Kontak | Butuh informasi lebih lanjut? Hubungi pustakawan institusi ini. |